Electronics, semiconductor & solar
16k Linea CLHS line scan camera offers higher throughput
31/03/2017
Teledyne DALSA’s new Linea 16k CLHS line scan camera is the first in the Linea range to utilise the high data transmission CLHS interface. 2 GByte/sec data throughput using a single CX4 cable with long transmission distances and cable flexibility, and an outstanding line rate up to 71 kHz, allow even higher inspection throughput to be achieved. Application areas include pharmaceutical labels and print inspection and flat panel display, printed circuit board and electronic component inspection.
Temperature measurement fully integrated into automated inspection processes
21/02/2017
STEMMER IMAGING has developed a subroutine for the Sherlock machine vision environment that allows fully calibrated temperature measurements from an LWIR camera to be seamlessly included in machine vision measurements.
9 and 12 megapixel sensors added to Genie Nano GigE camera family
01/02/2017
Sony Pregius’ IMX 255 and IMX 253 image sensors have been added to the Teledyne DALSA range of Genie Nano GigE Vision industrial cameras. With 9 megapixel (4KHD) and 12 Megapixel resolution respectively and available in both monochrome and colour, these four new models bring additional options for systems designers while retaining the high quality imaging, speed, build quality and low price point for which the Genie Nano family is renowned.
Machine vision in the photovoltaic industry
05/07/2010
The automation experts at ECKELMANN AG located in Wiesbaden use machine vision technology by STEMMER IMAGING in various photovoltaic production applications to provide a number...
Full surface 3D X-ray inspection at line speed
27/07/2009
GÖPEL electronic GmbH is a leading innovator in the development of quality assurance solutions for the electronic component manufacturing sector. The Jena based company uses...
Highly accurate 2D and 3D inspection
16/12/2008
Using imaging components supplied by STEMMER IMAGING, the Mainz based system integrator IMSTec has developed a high-speed optical inspection system for power electronic base plates....
